Mar 11, 2025 12:00 pm
5602 Beckman Institute
- Sponsor
- Beckman Institute for Advanced Science and Technology
- Speaker
- Miles Bimrose
- Registration
- Registration
- Contact
- Bishop Gonzalez
- jbgonza2@illinois.edu
- Views
- 98
Please join us at noon on Wednesday, March 11, in 5602 Beckman to learn about Detecting Hidden Defects in Manufactured Components using Computer Vision and X-ray Computed Tomography presented by Miles Bimrose.
Lunch will be provided to those who register for in-person attendance. Please register by Thursday, March 6.