Prelim Exam: Derek Chaw
- Event Type
- Seminar/Symposium
- Sponsor
- ECE
- Location
- ECEB 5086
- Date
- Apr 21, 2025 4:00 - 6:00 pm
- Views
- 177
Prelim Exam: Derek Chaw
Device Scaling Effects on High-Speed Cryogenic VCSEL Performance
Prelim Exam: Derek Chaw
Device Scaling Effects on High-Speed Cryogenic VCSEL Performance
Electrical and Computer Engineering
The Grainger College of Engineering
1070 ECE Building
306 N. Wright St. MC 702
Urbana, IL 61801
Phone: 217-333-2300
Contact: ece@illinois.edu