“Measuring materials properties at the single atom level using atomic electron tomography”
Transmission electron microscopy is an important technique in materials science to examine the atomic structure of materials with sub-Å resolution and single-atom sensitivity. Combining this imaging tool with powerful iterative 3D reconstruction algorithms for electron tomography is opening a new field called atomic electron tomography (AET) with the ability to determine the 3D coordinates of atoms in a structure without the assumption of crystallinity. Further, we demonstrate the ability to directly input experimentally determined atomic coordinates to ab initio calculations for new insights into materials properties. AET enables the ability to measure atomic defects, order and disorder and their structure-property relationships beyond traditional crystallinity.