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INVITED LECTURE - Designing Reliable Electronic Systems: From Atoms to Applications

Event Type
Assoc. Prof. Can Bayram
wifi event
Mar 22, 2022 - Mar 23, 2022   12:00 - 1:00 pm  
Prof. Ron Schrimpf
Assoc. Prof. Can Bayram
Originating Calendar
Illinois ECE Calendar


If you would like to meet (virtually) with the speaker, please contact Prof. Can Bayram ( for one-on-one meeting scheduling.

Designing Reliable Electronic Systems: From Atoms to Applications

Prof. Ron Schrimpf,

Institute for Space and Defense Electronics, Vanderbilt University

Abstract: Complex systems, such as satellites or autonomous vehicles, may include a wide variety of technologies with differing operating principles and reliability challenges. Assuring the reliability of these systems is time-consuming and may result in significant overdesign or lead to rejection of parts that would contribute to improved capability. One of the main reliability challenges for electronic systems is the effects of radiation, which may originate from cosmic rays, radioactive materials in packaging, or the natural radiation environment. The US Air Force recently launched a Center of Excellence in Radiation Effects, led by Vanderbilt researchers, with the goals of (1) developing and applying new predictive capabilities to enable radiation-tolerant designs utilizing emerging materials and technologies through the development, validation, and application of multi-scale simulations and (2) using coordinated experimental and theoretical methods to determine the fundamental mechanisms that underlie the radiation response of emerging compound-semiconductor and silicon-based technologies for use in radiation environments. The work conducted as part of this Center of Excellence will enhance the understanding of radiation effects in materials and devices, including wide and ultrawide bandgap semiconductors, infrared detectors, and space solar cells, as well as next-generation silicon-based and silicon-derived technologies. This approach will enable efficient design and qualification of new radiation-tolerant parts, assessment of the reliability and survivability of emerging technologies, and quantification of radiation-induced permanent damage and error rates. This talk will describe the mechanisms of radiation effects in electronic devices and approaches for determining the radiation-related reliability of emerging technologies.

Biography: Ronald D. Schrimpf received the B.E.E., M.S.E.E., and Ph.D. degrees from the University of Minnesota. He was a faculty member at the University of Arizona from 1986-1996. Since 1996, he has been with Vanderbilt University, where he currently is the Orrin Henry Ingram Professor of Engineering and Director of the Institute for Space and Defense Electronics. His research focuses on reliability and survivability of electronics for use in extreme environments, particularly those in which they are exposed to high levels of radiation. He was Principal Investigator for two Multi-Disciplinary University Research Initiatives dealing with physical mechanisms related to radiation response and reliability of emerging electronic technologies and he currently is Principal Investigator for the AF Center of Excellence in Radiation Effects. Ron has served as the General Chair and Technical Chair of the IEEE Nuclear and Space Radiation Effects Conference, Chair of the IEEE Radiation Effects Steering Group, and President of the IEEE Nuclear and Plasma Sciences Society.


Topic: INVITED TALK - Prof. Ron Schrimpf

Time: Mar 22, 2022 12:00 PM Central Time (US and Canada)

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Meeting ID: 837 7562 9552

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