Abstract: As scientists push materials toward the atomic thickness limit to improve performance and efficiency, understanding their nanoscale mechanical behavior and structure has become increasingly important. Two-dimensional materials, such as graphene and other van der Waals crystals, can exhibit unique friction and coupling effects that influence their functionality in real devices. Torsional Force Microscopy (TFM) is an advanced form of Atomic Force Microscopy (AFM) that measures how a tiny cantilever twists in response to shear and frictional forces, revealing properties that conventional AFM cannot detect. In this talk, I will explain the principles behind both AFM and TFM, how they can probe properties in 2D materials, and how our lab is working to utilize and improve torsional sensitivity for new, more accurate measurements.
Join via Zoom: https://illinois.zoom.us/j/84701225497?pwd=Xln6ZCKraIhgRswrUDdn1NfpTlOK4A