“Synchrotron X-ray Scanning Tunneling Microscopy: New Opportunities for the Characterization of Nanoscale Materials with Chemical and Magnetic Contrast”
The combination of the ultimate spatial resolution of scanning probe microscopy with the chemical and magnetic sensitivity of synchrotron x-rays has opened the prospect for an entirely new way of nanoscale materials’ characterization. Over the last couple of years, Argonne National Laboratory has pioneered the development of synchrotron x-ray scanning tunneling microscopy (SX-STM). The technique has demonstrated imaging with direct elemental contrast down to the level of single atom height as well as imaging of nanoscale magnetic domains of thin films.
In order to open up this new capability to the entire science community, and to fully exploit the special capabilities of the technique, XTIP, a dedicated beamline for SX-STM has been construction at Argonne’s Advanced Photon Source. To meet the scientific objective of the nanoscience and nanomagnetism communities most effectively, XTIP offers full polarization control over the 400-1900 eV photon energy range. The dedicated XTIP beamline provides researchers access to a one-of-a-kind instrument. Among the potential breakthroughs are “designer” materials created from controlled assemblies of atoms and molecules, and the emergence of entirely new phenomena in chemistry and physics.
Examples ranging from advanced battery materials to photovoltaics and the study of physical properties of molecules will be presented.
